Name
Abstract | ||
|---|---|---|
RF reliability at 28GHz in PAFETs under constant and varying output load (Z0) was evaluated. Time domain analyses show that in addition to non-conducting TDDB (ncTDDB), both conducting (cHCI) and non-conducting Hot Carrier Injection (ncHCI) degradation play key roles as primary mechanisms. RF power as stress variable under linear, P1dB and compression shows higher degradation in compression attrib... |
Year | DOI | Venue |
|---|---|---|
2021 | 10.1109/IRPS46558.2021.9405220 | 2021 IEEE International Reliability Physics Symposium (IRPS) |
Keywords | DocType | ISSN |
Radio frequency,Degradation,5G mobile communication,Power amplifiers,Integrated circuit reliability,Integrated circuit modeling,Time-domain analysis | Conference | 1541-7026 |
ISBN | Citations | PageRank |
978-1-7281-6893-7 | 0 | 0.34 |
References | Authors | |
0 | 13 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| P. Srinivasan | 1 | 0 | 0.34 |
| F. Guarin | 2 | 0 | 0.34 |
| S. Syed | 3 | 0 | 0.34 |
| J. A. S. Jerome | 4 | 0 | 0.34 |
| W. Liu | 5 | 0 | 0.34 |
| S. Jain | 6 | 0 | 0.34 |
| D. Lederer | 7 | 0 | 0.34 |
| S. Moss | 8 | 0 | 0.34 |
| P. Colestock | 9 | 0 | 0.34 |
| A. Bandyopadhyay | 10 | 0 | 0.34 |
| N. Cahoon | 11 | 0 | 0.34 |
| B. Min | 12 | 0 | 0.34 |
| M. Gall | 13 | 0 | 0.34 |