Name
Abstract | ||
|---|---|---|
In this work, the retention characteristics of multilevel HfO2 resistive random access memory (RRAM) based synaptic array was statistically measured from a 90 nm test chip and modeled at different temperatures. We found that not only the average conductance (especially at the intermediate states) drifts but also the variance of conductance exacerbates at elevated temperatures. To investigate the i... |
Year | DOI | Venue |
|---|---|---|
2021 | 10.1109/IRPS46558.2021.9405210 | 2021 IEEE International Reliability Physics Symposium (IRPS) |
Keywords | DocType | ISSN |
Temperature measurement,Temperature distribution,Semiconductor device measurement,Resistive RAM,Neural networks,Data models,Integrated circuit modeling | Conference | 1541-7026 |
ISBN | Citations | PageRank |
978-1-7281-6893-7 | 0 | 0.34 |
References | Authors | |
0 | 5 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Wonbo Shim | 1 | 1 | 1.69 |
| Jian Meng | 2 | 3 | 1.07 |
| Xiaochen Peng | 3 | 61 | 12.17 |
| Jae-sun Seo | 4 | 536 | 56.32 |
| Shimeng Yu | 5 | 490 | 56.22 |