Name
Title | ||
|---|---|---|
A 40nm 100Kb 118.44TOPS/W Ternary-weight Computein-Memory RRAM Macro with Voltage-sensing Read and Write Verification for reliable multi-bit RRAM operation |
Abstract | ||
|---|---|---|
RRAM is a promising candidate for compute-in-memory (CIM) applications owing to its natural multiply-and-accumulate (MAC)-supporting structure, high bit-density, non-volatility, and a monolithic CMOS and RRAM process. In particular, multi-bit encoding in RRAM cells helps support advanced applications such as AI with higher MAC throughput and bit-density. Notwithstanding prior efforts into commerci... |
Year | DOI | Venue |
|---|---|---|
2021 | 10.1109/CICC51472.2021.9431412 | 2021 IEEE Custom Integrated Circuits Conference (CICC) |
Keywords | DocType | ISBN |
Resistance,Conferences,Throughput,Encoding,Common Information Model (computing),Iterative methods,Convolutional neural networks | Conference | 978-1-7281-7581-2 |
Citations | PageRank | References |
2 | 0.37 | 0 |
Authors | ||
6 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Jong-Hyeok Yoon | 1 | 5 | 1.79 |
| Muya Chang | 2 | 5 | 2.11 |
| Win-San Khwa | 3 | 29 | 5.14 |
| Yu-Der Chih | 4 | 5 | 1.79 |
| Meng-Fan Chang | 5 | 2 | 1.05 |
| Arijit Raychowdhury | 6 | 514 | 71.77 |