Name
Abstract | ||
|---|---|---|
Learning a powerful distance metric is the key component of image retrieval. Recently, deep metric learning has been an active research topic for image retrieval. However, most existing metric learning approaches treat all the input images equally and learn all image embeddings at equal lengths. These methods ignore those easy examples that can be encoded as the shorter features, which is search-i... |
Year | DOI | Venue |
|---|---|---|
2021 | 10.1109/CSCWD49262.2021.9437834 | 2021 IEEE 24th International Conference on Computer Supported Cooperative Work in Design (CSCWD) |
Keywords | DocType | ISBN |
Measurement,Learning systems,Training,Conferences,Image retrieval,Benchmark testing,Collaborative work | Conference | 978-1-7281-6597-4 |
Citations | PageRank | References |
0 | 0.34 | 12 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Yujie Hu | 1 | 0 | 0.34 |
| Hanjiang Lai | 2 | 234 | 17.67 |
| Yan Pan | 3 | 179 | 19.23 |