Title
Long-term memory performance with learning behavior of artificial synaptic memristor based on stacked solution-processed switching layers
Abstract
In this work, oxide resistive random access memory (OxRRAM) devices with stacked solution-processed (SP) metal oxide (MO) layers were fabricated to investigate artificial synaptic behavior such as long-term potentiation (LTP) and long-term depression (LTD). The stacked RRAM devices exhibited stable and repeated bipolar IV curves with operation voltage lower than the similar to 0.5 V and a switching ratio larger than 2x10(4). Also, with the stimuli from external consecutive pulses, the stacked devices demonstrated learning-forgetting-relearning behavior similar to neuron-induced behavior in the human brain. Finally, based on stable long-term memory performance, the pattern recognition system with an artificial neuron network (ANN) algorithm was simulated with the recognition accuracy higher than 95%.
Year
DOI
Venue
2021
10.1109/ISCAS51556.2021.9401493
2021 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS)
Keywords
DocType
ISSN
solution-processed, synaptic behavior, human brain, RRAM
Conference
0271-4302
Citations 
PageRank 
References 
0
0.34
0
Authors
5
Name
Order
Citations
PageRank
Zongjie Shen100.34
Ce Zhou Zhao201.01
Ka Lok Man38827.99
Yina Liu402.03
Cezhou Zhao500.34