Title
Fabrication of Nanoslits with <111> Etching TSWE Method
Abstract
In this paper, we report a modified three step anisotropic wet etching (TSWE) method to fabricate solid-state silicon nanoslits. The slit-opening process is performed by crystal plane etching. The etching rate of the crystal plane is reasonably slow as it is only 1/45 of the etching rate, thus allowing and therefore good slits-opening controllability. By slowly etching the ...
Year
DOI
Venue
2021
10.1109/NEMS51815.2021.9451489
2021 IEEE 16th International Conference on Nano/Micro Engineered and Molecular Systems (NEMS)
Keywords
DocType
ISSN
Fabrication,Wet etching,Nanoelectromechanical systems,Conferences,Crystals,Controllability,Nonhomogeneous media
Conference
2474-3747
ISBN
Citations 
PageRank 
978-1-6654-1941-3
0
0.34
References 
Authors
0
6
Name
Order
Citations
PageRank
Hao Hong100.34
Li Ye200.34
Ke Li300.34
Pasqualina M. Sarro400.34
G.Q. Zhang513651.65
Zewen Liu625.78