Title
Design and Test of Innovative Three-Couplers-Based Bandpass Negative Group Delay Active Circuit
Abstract
<italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">Editor’s notes:</i> This article presents a method for designing bandpass (BP) negative group delay (NGD) active circuits. The circuit topology consists of a distributed BP NGD passive circuit cascaded with a microwave amplifier. The design is validated through simulations and measurements of a prototype implementation. <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">—Binoy Ravindran, Virginia Tech</i>
Year
DOI
Venue
2022
10.1109/MDAT.2021.3079178
IEEE Design & Test
Keywords
DocType
Volume
Active topology,Coupled line (CL),Microwave circuit,Bandpass (BP) negative group delay (NGD),Transmission line (TL),Characterization test
Journal
39
Issue
ISSN
Citations 
1
2168-2356
0
PageRank 
References 
Authors
0.34
0
7
Name
Order
Citations
PageRank
Fayu Wan124.14
Taochen Gu200.34
Sébastien Lalléchère322.16
Preeti Thakur411.06
Atul Thakur51008.22
Wenceslas Rahajandraibe665.04
b ravelo7108.79