Name
Title | ||
|---|---|---|
Critical Path Isolation and Bit-Width Scaling Are Highly Compatible for Voltage Over-Scalable Design. |
Year | DOI | Venue |
|---|---|---|
2021 | 10.23919/DATE51398.2021.9473946 | DATE |
DocType | Citations | PageRank |
Conference | 0 | 0.34 |
References | Authors | |
0 | 6 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Yutaka Masuda | 1 | 1 | 3.10 |
| Jun Nagayama | 2 | 0 | 1.69 |
| TaiYu Cheng | 3 | 0 | 0.34 |
| Tohru Ishihara | 4 | 0 | 2.37 |
| Yoichi Momiyama | 5 | 0 | 1.69 |
| Masanori Hashimoto | 6 | 5 | 2.54 |