Name
Title | ||
|---|---|---|
Towards fully automated testing and characterization for photonic compact modeling on 300-mm wafer platform |
Abstract | ||
|---|---|---|
We demonstrate a fully automated and flexible wafer level photonic device testing and characterization with wavelength, optical power, temperature, and voltage dependencies. High precision setup and data analysis tools are developed for photonic compact modeling. |
Year | Venue | DocType |
|---|---|---|
2021 | 2021 OPTICAL FIBER COMMUNICATIONS CONFERENCE AND EXPOSITION (OFC) | Conference |
Citations | PageRank | References |
0 | 0.34 | 0 |
Authors | ||
12 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Abdelsalam Aboketaf | 1 | 0 | 0.34 |
| Crystal Hedges | 2 | 0 | 0.34 |
| Vishal Dhurgude | 3 | 0 | 0.34 |
| Brendan Harris | 4 | 0 | 0.34 |
| Fen Guan | 5 | 0 | 0.34 |
| Frank Pavlik | 6 | 0 | 0.34 |
| Ted Anderson | 7 | 0 | 0.34 |
| Andy Stricker | 8 | 0 | 0.34 |
| Yusheng Bian | 9 | 0 | 0.68 |
| Michal Rakowski | 10 | 0 | 0.68 |
| Arunima Dasgupta | 11 | 0 | 0.34 |
| Andrea Paganini | 12 | 0 | 0.34 |