Title
Optical Arbitrary Waveform Measurement (OAWM) on the Silicon Photonic Platform
Abstract
We demonstrate optical arbitrary waveform measurement (OAWM) using a silicon photonic spectral slicer. Exploiting maximal-ratio combining (MRC), we demonstrate the viability of the scheme by reconstructing 100-GBd 64QAM signals with high quality.
Year
Venue
DocType
2021
2021 OPTICAL FIBER COMMUNICATIONS CONFERENCE AND EXPOSITION (OFC)
Conference
Citations 
PageRank 
References 
0
0.34
0
Authors
15