Title
Cryogenic Characterization of 16 nm FinFET Technology for Quantum Computing
Abstract
This study presents the first in depth characterization of deep cryogenic electrical behavior of a commercial 16 nm CMOS FinFET technology. This technology is well suited for a broad range of applications, including quantum computing, quantum sensing, and quantum communications. Cryogenic DC measurements and physical parameters extraction were carried out on this commercial FinFET technology, oper...
Year
DOI
Venue
2021
10.1109/ESSCIRC53450.2021.9567747
ESSCIRC 2021 - IEEE 47th European Solid State Circuits Conference (ESSCIRC)
Keywords
DocType
ISSN
Semiconductor device modeling,Geometry,Temperature sensors,Solid modeling,Quantum computing,Computational modeling,Cryogenics
Conference
1930-8833
ISBN
Citations 
PageRank 
978-1-6654-3751-6
0
0.34
References 
Authors
0
6
Name
Order
Citations
PageRank
Hung-Chi Han100.68
farzan jazaeri284.00
Antonio D'Amico300.68
A. Baschirotto417654.55
Edoardo Charbon500.68
Christian Enz600.68