Title
NeurFill: Migrating Full-Chip CMP Simulators to Neural Networks for Model-Based Dummy Filling Synthesis
Abstract
Dummy filling is widely applied to significantly improve the planarity of topographic patterns for the chemical mechanical polishing (CMP) process in VLSI manufacturing. This paper proposes a novel model-based dummy filling synthesis framework NeurFill, integrated with multiple starting points-sequential quadratic programming (MSP-SQP) optimization solver. Inside this framework, a full-chip CMP si...
Year
DOI
Venue
2021
10.1109/DAC18074.2021.9586325
2021 58th ACM/IEEE Design Automation Conference (DAC)
Keywords
DocType
ISSN
Backpropagation,Semiconductor device modeling,Design automation,Neural networks,Very large scale integration,Filling,Manufacturing
Conference
0738-100X
ISBN
Citations 
PageRank 
978-1-6654-3274-0
0
0.34
References 
Authors
0
6
Name
Order
Citations
PageRank
Junzhe Cai100.68
Changhao Yan2276.64
Yuzhe Ma300.34
Bei Yu465674.07
Dian Zhou526056.14
Xuan Zeng640875.96