Name
Title | ||
|---|---|---|
Measurement of Ion Motion Caused by Laser-Induced Stray Charges on Microfabricated Ion Trap Chip Surfaces |
Abstract | ||
|---|---|---|
The stray charges induced on ion trap surfaces can push trapped ions away from a pseudopotential null point. This can cause the micromotion of the trapped ions that in turn results in ion heating. One of the causes of stray charges is laser scattering on dielectric surfaces. The amount of laser-induced stray charges can be related to the area of the dielectric surface exposed to the ions. In this ... |
Year | DOI | Venue |
|---|---|---|
2021 | 10.1109/QCE52317.2021.00064 | 2021 IEEE International Conference on Quantum Computing and Engineering (QCE) |
Keywords | DocType | ISBN |
ion trap,laser induced stray charge,dielectric surface | Conference | 978-1-6654-1691-7 |
Citations | PageRank | References |
0 | 0.34 | 0 |
Authors | ||
5 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Changhyun Jung | 1 | 0 | 0.34 |
| Woojun Lee | 2 | 0 | 0.34 |
| Junho Jeong | 3 | 0 | 0.34 |
| Taehyun Kim | 4 | 234 | 30.74 |
| Dong-Il Dan Cho | 5 | 17 | 9.99 |