Title
The Fractional-N All Digital Frequency Locked Loop With Robustness For Pvt Variation And Its Application For The Microcontroller Unit
Abstract
This paper describes the Fractional-N All Digital Frequency Locked Loop (ADFLL) with Robustness for PVT variation and its application for the microcontroller unit. The conventional FLL is difficult to achieve the required specification by using the fine CMOS process. Especially, the conventional FLL has some problems such as unexpected operation and long lock time that are caused by PVT variation. To overcome these problems, we propose a new ADFLL which uses dynamic selecting digital filter coefficients. The proposed ADFLL was evaluatied through the HSPICE simulation and fabricating chips using a 0.13 mu m CMOS process. From these results, we observed the proposed ADFLL has robustness for PVT variation by using dynamic selecting digital filter coefficient, and the lock time is improved up to 57%, clock jitter is 0.85 nsec.
Year
DOI
Venue
2021
10.1587/transinf.2020LOP0008
IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS
Keywords
DocType
Volume
all digital frequency locked loop, fractional-N, PVT variation, microcontroller unit
Journal
E104D
Issue
ISSN
Citations 
8
1745-1361
0
PageRank 
References 
Authors
0.34
0
9
Name
Order
Citations
PageRank
Ryoichi Miyauchi100.34
Akio Yoshida200.34
Shuya Nakano300.34
Hiroki Tamura47221.29
Koichi Tanno500.34
Yutaka Fukuchi600.34
Yukio Kawamura700.34
Yuki Kodama800.34
Yuichi Sekiya900.34