Name
Abstract | ||
|---|---|---|
In recent years, the world of VLSI testing has been living a huge transformation pushed by constraints and requirements coming from a large variety of sources and applications. The traditional need for higher accessibility and controllability led to solutions such as IEEE 1687, while the need for reuse is pushing for innovations like P1687.1. All the while, these same features are raising security... |
Year | DOI | Venue |
|---|---|---|
2021 | 10.1109/ITC50571.2021.00050 | 2021 IEEE International Test Conference (ITC) |
Keywords | DocType | ISSN |
Automated Test Environments,Domain-Specific Languages,Callbacks,Reconfigurable Scan Networks,Secure Access,Authentication | Conference | 1089-3539 |
ISBN | Citations | PageRank |
978-1-6654-1695-5 | 0 | 0.34 |
References | Authors | |
0 | 5 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Michele Portolan | 1 | 11 | 5.50 |
| Vincent Reynaud | 2 | 0 | 0.34 |
| Paolo Maistri | 3 | 0 | 0.34 |
| regis leveugle | 4 | 370 | 32.01 |
| Giorgio Di Natale | 5 | 0 | 0.34 |