Name
Title | ||
|---|---|---|
Multi-Transition Fault Model (MTFM) ATPG patterns towards achieving 0 DPPB on automotive designs |
Abstract | ||
|---|---|---|
After a continued analysis of more than a year to reduce DPPB on NXP automotive designs, it was observed that some subtle at-speed defects were not getting screened out using combination of traditional Stuck-At, Transition-Delay and Small-Delay-Defect based ATPG patterns. Traditional delay fault models for automatic test pattern generation target a single transition that propagates to the output(s... |
Year | DOI | Venue |
|---|---|---|
2021 | 10.1109/ITC50571.2021.00037 | 2021 IEEE International Test Conference (ITC) |
Keywords | DocType | ISSN |
ATPG,Multiple Transition,Zero Defect,UDFM | Conference | 1089-3539 |
ISBN | Citations | PageRank |
978-1-6654-1695-5 | 0 | 0.34 |
References | Authors | |
0 | 5 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Jorge Corso | 1 | 0 | 0.34 |
| Saidapet Ramesh | 2 | 0 | 0.34 |
| Kumar Abishek | 3 | 0 | 0.34 |
| Ley Teng Tan | 4 | 0 | 0.34 |
| Chik Hooi Lew | 5 | 0 | 0.34 |