Name
Abstract | ||
|---|---|---|
Reconfigurable scan networks (RSNs), like IEEE Std. 1687 networks, offer flexible and scalable access to embedded (on-chip) instruments. These networks are typically accessed from the outside via a dedicated test port, like the test access port (TAP) of IEEE Std. 1149.1. As not all integrated circuits have a dedicated test port, the IEEE Std. P1687.1 working group is exploring how existing functio... |
Year | DOI | Venue |
|---|---|---|
2021 | 10.1109/ITC50571.2021.00051 | 2021 IEEE International Test Conference (ITC) |
Keywords | DocType | ISSN |
IEEE Std. P1687.1,IEEE Std. 1687,IEEE Std. 1149.1,functional port,embedded instruments | Conference | 1089-3539 |
ISBN | Citations | PageRank |
978-1-6654-1695-5 | 0 | 0.34 |
References | Authors | |
0 | 3 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Erik G. Larsson | 1 | 10189 | 605.81 |
| Prathamesh Murali | 2 | 0 | 1.69 |
| Ziling Zhang | 3 | 0 | 0.34 |