Title
Resistive switching performance of memristor with solution-processed stacked MO/2D-materials switching layers
Abstract
In this work, the RRAM device with the structure of Ag/AlOx/MXene/ITO was fabricated with the stacked solution-processed switching layers. The device operated with a low voltage around ~2.0 V and exhibited a stable ON/OFF ratio larger than 104. Apart from excellent stability with endurance cycles of more than 100 and retention time of longer than 104 s, typical synaptic behav...
Year
DOI
Venue
2021
10.1109/ICICDT51558.2021.9626507
2021 International Conference on IC Design and Technology (ICICDT)
Keywords
DocType
ISSN
synaptic behaviors,pattern recognition,MXene,RRAM
Conference
2381-3555
ISBN
Citations 
PageRank 
978-1-6654-4998-4
0
0.34
References 
Authors
0
6
Name
Order
Citations
PageRank
Zongjie Shen100.34
Chun Zhao200.34
Ivona Z Mitrovic300.68
Cezhou Zhao400.34
Yina Liu502.03
Li Yang600.34