Name
Title | ||
|---|---|---|
Analysis of Switching Characteristics of Wide SOA and High Reliability 100 V N-LDMOS Transistor with Dual RESURF and Grounded Field Plate Structure. |
Year | DOI | Venue |
|---|---|---|
2021 | 10.1109/ASICON52560.2021.9620319 | ASICON |
DocType | Citations | PageRank |
Conference | 0 | 0.34 |
References | Authors | |
0 | 3 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Anna Kuwana | 1 | 0 | 1.01 |
| Jun-Ichi Matsuda | 2 | 0 | 0.34 |
| Haruo Kobayashi | 3 | 27 | 7.46 |