Name
Abstract | ||
|---|---|---|
With the rapid development of semiconductors and the continuous scaling-down of circuit feature size, hotspot detection has become much more challenging and crucial as a critical step in the physical verification flow. In recent years, advanced deep learning techniques have spawned many frameworks for hotspot detection. However, most existing hotspot detectors can only detect defects arising in th... |
Year | DOI | Venue |
|---|---|---|
2021 | 10.1109/ICCAD51958.2021.9643590 | 2021 IEEE/ACM International Conference On Computer Aided Design (ICCAD) |
Keywords | DocType | ISSN |
Location awareness,Design automation,Layout,Refining,Detectors,Transformers,Multitasking | Conference | 1933-7760 |
ISBN | Citations | PageRank |
978-1-6654-4507-8 | 1 | 0.35 |
References | Authors | |
0 | 7 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Binwu Zhu | 1 | 1 | 0.35 |
| Ran Chen | 2 | 41 | 8.42 |
| Xinyun Zhang | 3 | 1 | 0.35 |
| Fan Yang | 4 | 101 | 22.74 |
| Xuan Zeng | 5 | 408 | 75.96 |
| Bei Yu | 6 | 656 | 74.07 |
| Martin D. F. Wong | 7 | 3525 | 363.70 |