Abstract | ||
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The improvement of image quality is fundamental to further the application of Electrical Impedance Tomography (EIT) in industry and clinics. The majority of EIT image reconstruction algorithms are linearization methods based on Finite Element Method (FEM). As we know, the meshing structure of the sensing field is important to FEM performance, in this paper, we investigate the optimization of finit... |
Year | DOI | Venue |
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2021 | 10.1109/IST50367.2021.9651335 | 2021 IEEE International Conference on Imaging Systems and Techniques (IST) |
Keywords | DocType | ISBN |
Electrodes,Analytical models,Electrical impedance tomography,Sensitivity,Conductivity,Finite element analysis,Sensors | Conference | 978-1-7281-7371-9 |
Citations | PageRank | References |
1 | 0.35 | 0 |
Authors | ||
5 |
Name | Order | Citations | PageRank |
---|---|---|---|
Mingzhu Zhang | 1 | 1 | 1.03 |
Shan Xue | 2 | 1 | 0.35 |
Hui Qin | 3 | 1 | 0.35 |
Zhibin Kong | 4 | 1 | 0.35 |
Yixin Ma | 5 | 9 | 4.12 |