Title
The Importance of FEM model for Linearized EIT Image Reconstruction
Abstract
The improvement of image quality is fundamental to further the application of Electrical Impedance Tomography (EIT) in industry and clinics. The majority of EIT image reconstruction algorithms are linearization methods based on Finite Element Method (FEM). As we know, the meshing structure of the sensing field is important to FEM performance, in this paper, we investigate the optimization of finit...
Year
DOI
Venue
2021
10.1109/IST50367.2021.9651335
2021 IEEE International Conference on Imaging Systems and Techniques (IST)
Keywords
DocType
ISBN
Electrodes,Analytical models,Electrical impedance tomography,Sensitivity,Conductivity,Finite element analysis,Sensors
Conference
978-1-7281-7371-9
Citations 
PageRank 
References 
1
0.35
0
Authors
5
Name
Order
Citations
PageRank
Mingzhu Zhang111.03
Shan Xue210.35
Hui Qin310.35
Zhibin Kong410.35
Yixin Ma594.12