Name
Abstract | ||
|---|---|---|
This paper presents a comparative analysis of radiation sensitivity and SET mitigation techniques for the Mirror Full Adder topology implemented with FinFET devices at 7 nm node, considering nominal and near-threshold operation. The mitigation techniques investigated are Decoupling Cells and Transistor Sizing. Transistor Sizing may improved robustness up to $2\mathrm{x}$ (nominal) and c... |
Year | DOI | Venue |
|---|---|---|
2021 | 10.1109/LATS53581.2021.9651889 | 2021 IEEE 22nd Latin American Test Symposium (LATS) |
Keywords | DocType | ISBN |
Sensitivity,FinFETs,Robustness,Topology,Mirrors,Transistors,Adders | Conference | 978-1-6654-2057-0 |
Citations | PageRank | References |
0 | 0.34 | 0 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Rafael N. M. Oliveira | 1 | 0 | 0.34 |
| Fábio G. R. G. da Silva | 2 | 0 | 0.68 |
| Ricardo Reis | 3 | 0 | 0.34 |
| Cristina Meinhardt | 4 | 0 | 0.34 |