Name
Title | ||
|---|---|---|
In Situ Aging-Aware Error Monitoring Scheme for IMPLY-Based Memristive Computing-in-Memory Systems |
Abstract | ||
|---|---|---|
Stateful logic through memristor is a promising technology to build Computing-in-Memory (CIM) systems. However, aging-induced degradation of memristors’ threshold voltage imposes a major challenge to the reliability and guardbands estimation of memristive CIM systems, especially the Material Implication (IMPLY) logic based CIM systems. In this paper, a novel in-situ aging-aware error monitoring sc... |
Year | DOI | Venue |
|---|---|---|
2022 | 10.1109/TCSI.2021.3095545 | IEEE Transactions on Circuits and Systems I: Regular Papers |
Keywords | DocType | Volume |
Memristors,Monitoring,Threshold voltage,Reliability,Logic gates,Degradation,Programming | Journal | 69 |
Issue | ISSN | Citations |
1 | 1549-8328 | 0 |
PageRank | References | Authors |
0.34 | 0 | 9 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Jiarui Xu | 1 | 0 | 0.34 |
| Yi Zhan | 2 | 1 | 1.36 |
| Yujie Li | 3 | 0 | 0.34 |
| Jiajun Wu | 4 | 1 | 1.36 |
| Xinglong Ji | 5 | 1 | 1.36 |
| Guoyi Yu | 6 | 0 | 1.69 |
| Wenyu Jiang | 7 | 0 | 0.34 |
| Rong Zhao | 8 | 0 | 0.34 |
| Chao Wang | 9 | 0 | 0.68 |