Title
Few-Shot Defect Segmentation Leveraging Abundant Defect-Free Training Samples Through Normal Background Regularization And Crop-And-Paste Operation.
Year
DOI
Venue
2021
10.1109/ICME51207.2021.9428468
ICME
DocType
Citations 
PageRank 
Conference
0
0.34
References 
Authors
0
4
Name
Order
Citations
PageRank
Dongyun Lin113.06
Yanpeng Cao200.34
Wenbin Zhu301.35
Yiqun Li411.64