Abstract | ||
---|---|---|
We characterize the redundancy effect on EM failure time in power grid networks and propose a flow to leverage the benefit of the redundancy effect on EDA tools. Experimental results fit Monte-Carlo simulation based on a parallel model incorporating time-dependent stress loading. Ring oscillator frequency degradation and clock tree time delay are also evaluated on simplified power mesh networks as... |
Year | DOI | Venue |
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2022 | 10.1109/IRPS48227.2022.9764495 | 2022 IEEE International Reliability Physics Symposium (IRPS) |
Keywords | DocType | ISBN |
Degradation,Ring oscillators,Mesh networks,Time-frequency analysis,Monte Carlo methods,Delay effects,Redundancy | Conference | 978-1-6654-7950-9 |
Citations | PageRank | References |
0 | 0.34 | 0 |
Authors | ||
4 |
Name | Order | Citations | PageRank |
---|---|---|---|
M. H. Lin | 1 | 0 | 0.34 |
Chih-Lin I | 2 | 2167 | 211.25 |
C. Wang | 3 | 120 | 11.11 |
Aaron Wang | 4 | 0 | 0.34 |