Title
A 0.9-V DAC-Calibration-Free Continuous-Time Incremental Delta–Sigma Modulator Achieving 97-dB SFDR at 2 MS/s in 28-nm CMOS
Abstract
This article shows the design of a wideband 3-0 sturdy-multi-stage noise-shaping (SMASH) continuous-time (CT) incremental delta–sigma (I- <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\boldsymbol {\Delta \Sigma }$ </tex-math></inline-formula> ) analog-to-digital converter (ADC). The two stages’ quantizers (QTZs) are implemented by a single re-configurable multibit (MB) asynchronous (A)SAR ADC. The digital-to-analog converter (DAC) nonlinearities are suppressed by reconfiguring the asynchronous successive-approximation register (ASAR) ADC from 2 to 5 b, and correspondingly, the DACs dynamically switch from 1.5- to 4-b tri-level outputs within each Nyquist conversion cycle. This results in a DAC-calibration-free MB operation. A two-tap FIR filter is implemented in the feedback DACs to reduce jitter requirements in the initial 1.5-b cycles. Through the design representation, a detailed fundamental comparison between an X-0 SMASH architecture and an X-order single-loop modulator is discussed. This discussion highlights the introduction of an efficient tri-level combination between the MSB and the LSBs of the ASAR QTZ. The resulting SMASH CT I- <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\boldsymbol {\Delta \Sigma }$ </tex-math></inline-formula> modulator was fabricated in 28-nm CMOS technology with an active area of 0.125 mm2. It achieves 97-dB spurious-free dynamic range (SFDR) without calibration, 89-dB dynamic range (DR), and 81.2-dB SNDR in a 1-MHz bandwidth (BW). It consumes 3.6 mW from a single 0.9-V supply. The design shows very good robustness across different tested samples, supply variations, and across temperatures from −20 °C to 80 °C.
Year
DOI
Venue
2022
10.1109/JSSC.2022.3160325
IEEE Journal of Solid-State Circuits
Keywords
DocType
Volume
Asynchronous successive-approximation register (ASAR) quantizer (QTZ),continuous time (CT),delta–sigma modulator,incremental,sturdy-multi-stage noise-shaping (SMASH),tri-level digital-to-analog converter (DAC)
Journal
57
Issue
ISSN
Citations 
11
0018-9200
0
PageRank 
References 
Authors
0.34
27
6
Name
Order
Citations
PageRank
Mohamed A. Mokhtar112.38
Ahmed Abdelaal200.34
Markus Sporer300.34
Joachim Becker411.02
John G. Kauffman511.02
Maurits Ortmanns6501114.46