Title
Detecting technological maturity from bibliometric patterns
Abstract
•Identify emergent technologies from open-source indicators using binary classifier.•Transition between emergence and growth is encoded in the shape of the curve.•Artificial neural network learns technology maturity based on derivatives of curve.•Data augmentation improves classifier performance by increasing training corpus.
Year
DOI
Venue
2022
10.1016/j.eswa.2022.117177
Expert Systems with Applications
Keywords
DocType
Volume
Technology life cycle,Machine learning,Artificial neural network,Data augmentation
Journal
201
ISSN
Citations 
PageRank 
0957-4174
0
0.34
References 
Authors
0
5
Name
Order
Citations
PageRank
Katherine Cauthen100.34
Prashant Rai200.34
Nicholas Hale300.34
Laura Freeman400.34
Jaideep Ray519824.42