Title
Exploring Different Circuit-level Approaches to the Forming of Resistive Random Access Memories
Abstract
Advances in emerging resistive random-access memory (ReRAM) technology show promise to be used in future memory-centric computing systems. In ReRAM arrays that consist of two-terminal bipolar resistive switching (RS) devices, SET/RESET programming voltage pulses are used to switch them from low resistance state (LRS) to high resistance state (HRS). The recent commercialization of discrete and crossbar-array organized RS devices have certainly pushed forward experimentation with such emerging memory technology. One barrier still preventing their widespread practical use is the behavioral variability and the lack of a straightforward manner to implement the forming process and achieve uniform SET/RESET programing. In this paper, different circuit topologies and approaches are explored to perform the forming of the conductive channel in commercial discrete RS devices by Knowm Inc. A target-resistance is pursued through pulsed voltage stress, followed by cycle-to-cycle stabilization using a custom transimpedance amplifier circuit. Moreover, a voltage controlled low–current source is proposed as an approach to alleviate the complexity and risk of the forming process in device characterization.
Year
DOI
Venue
2022
10.1109/MOCAST54814.2022.9837684
2022 11th International Conference on Modern Circuits and Systems Technologies (MOCAST)
Keywords
DocType
ISBN
memristor,resistive switching,resistive RAM,ReRAM,characterization,Knowm,conductive channel forming
Conference
978-1-6654-6718-6
Citations 
PageRank 
References 
0
0.34
3
Authors
4
Name
Order
Citations
PageRank
Albert Cirera100.34
Carlos Fernandez221.87
Ioannis Vourkas301.35
Antonio Rubio400.68