Title
Non-Volatile Resistive Switching in PtSe<inf>2</inf>-Based Crosspoint Memristors
Abstract
Two-dimensional (2D) materials such as transition metal dichalcogenides (TMDCs) have gained attention for neuromorphic computing applications due to their resistive switching (RS) behavior [1], [2]. Among TMDCs, platinum diselenide (PtSe <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf> ) stands out because it can be grown at complementary metal-oxide-semiconductor (CMOS) back-end-of-line (BEOL) compatible temperatures [3], [4] and it has shown excellent long-term stability [5]. However, its potential for RS remains largely unexplored with only preliminary proof-of-concept characteristics presented in a multilayer PtSe <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf> device with Au electrodes [6]. Here, we present the first detailed study on forming free RS in PtSe <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</inf> -based crosspoint (CP) memristors using CMOS-compatible electrodes. We find remarkably low switching fields (0.08 V /nm) likely related to our choice of electrode materials and excellent retention for at least several days.
Year
DOI
Venue
2022
10.1109/DRC55272.2022.9855787
2022 Device Research Conference (DRC)
Keywords
DocType
ISSN
nonvolatile resistive,transition metal dichalcogenides,TMDCs,neuromorphic computing applications,complementary metal-oxide-semiconductor back-end-of-line compatible temperatures,long-term stability,multilayer device,free RS,CMOS-compatible electrodes,low switching fields,electrode materials,crosspoint memristors,two-dimensional materials,2D materials,preliminary proof-of-concept characteristics,Au,PtSe2
Conference
1548-3770
ISBN
Citations 
PageRank 
978-1-6654-9884-5
0
0.34
References 
Authors
0
11