Name
Title | ||
|---|---|---|
Prediction of DC-AC Converter Efficiency Degradation due to Device Aging Using a Compact MOSFET-Aging Model. |
Year | Venue | DocType |
|---|---|---|
2020 | IEICE Transactions on Electronics | Journal |
Volume | Issue | ISSN |
103-C | 3 | 0916-8524 |
Citations | PageRank | References |
0 | 0.34 | 0 |
Authors | ||
7 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Kenshiro Sato | 1 | 0 | 0.34 |
| Dondee Navarro | 2 | 0 | 0.34 |
| Shinya Sekizaki | 3 | 0 | 0.34 |
| Yoshifumi Zoka | 4 | 0 | 0.34 |
| Naoto Yorino | 5 | 4 | 6.46 |
| Hans Jürgen Mattausch | 6 | 0 | 1.01 |
| Mitiko Miura-Mattausch | 7 | 11 | 16.18 |