Title
Generation of Test Sequences with Low Power Dissipation for Sequential Circuits.
Year
Venue
DocType
2004
IEICE Transactions on Information & Systems
Journal
Volume
Issue
ISSN
87-D
3
0916-8532
Citations 
PageRank 
References 
0
0.34
0
Authors
3
Name
Order
Citations
PageRank
Yoshinobu Higami100.34
Shin-ya Kobayashi233.77
Yuzo Takamatsu300.68