Author Info
Name
Affiliation
Papers
YONGBO LIU
Integrated Circuit Advanced Process Center, Institute of Microelectronics, University of Chinese Academy of Sciences, Beijing 100029, China
1
Collaborators
Citations 
PageRank 
5
0
0.34
Referers 
Referees 
References 
0
0
0
Title
Citations
PageRank
Year
Charge pumping test technique using CMOS ring oscillator on leakage issue.00.342017