Author Info
Name
Affiliation
Papers
LEQING ZHANG
State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China
1
Collaborators
Citations 
PageRank 
7
0
0.34
Referers 
Referees 
References 
0
16
3
Title
Citations
PageRank
Year
Degradation induced by TID radiation and hot-carrier stress in 130-nm short channel PDSOI NMOSFETs.00.342017