Author Info
Name
Affiliation
Papers
A. A. B. TIO
Precision Measurements Group, Singapore Institute of Manufacturing Technologies, Singapore
1
Collaborators
Citations 
PageRank 
5
0
0.34
Referers 
Referees 
References 
0
0
0
Title
Citations
PageRank
Year
Near-field detection of photon emission from silicon with 30 nm spatial resolution00.342008