Name
Papers
Collaborators
NOHPILL PARK
43
56
Citations 
PageRank 
Referers 
72
17.90
173
Referees 
References 
536
245
Search Limit
100536
Title
Citations
PageRank
Year
Hybrid Chain And Dependability00.342020
A Variable Bulk Arrival and Static Bulk Service Queueing Model for Blockchain00.342020
Slim Chain and Dependability00.342020
Transaction sampling algorithms for real-time crypto block dependability.00.342020
Availability modelling and assurance for a big data computing.00.342019
Optimized Common Parameter Set Extraction Framework By Multiple Benchmarking Applications On A Big Data Platform00.342018
The Dependability Of Crypto Linked Off-Chain File Systems In Backend Blockchain Analytics Engine00.342018
Availability Modeling and Assurance of Map-Reduce Computing.00.342017
Performance evaluation and tuning for MapReduce computing in Hadoop distributed file system00.342015
Dynamic data rebalancing in Hadoop10.372014
Modeling and analysis of repair and maintenance processes in Fault Tolerant Systems00.342013
Reliability Modeling and Analysis of Clockless Wave Pipeline Core for Embedded Combinational Logic Design00.342010
An extraction method of lip movement images from successive image frames in the speech activity extraction process00.342010
A New Approach for Time Series Forecasting based on Genetic Algorithm00.342010
Introduction to the special section on nanocircuits and systems00.342009
A Probabilistic Risk Estimation with Multiple Regression Dependent Dummy Variable Method using Logit Transformation00.342008
Modeling and Evaluation of Threshold Defect Tolerance00.342008
Designing layout-timing independent quantum-dot cellular automata (QCA) circuits by global asynchrony90.932007
Leakage Minimization Technique for Nanoscale CMOS VLSI20.512007
Cost-Driven Optimization of Coverage of Combined Built-In Self-Test/Automated Test Equipment Testing20.402007
Efficient and Robust Delay-Insensitive QCA (Quantum-Dot Cellular Automata) Design50.632006
Exploratory Data Analysis with Bivariate Dependence Functions00.342006
Environmental-based characterization of SoC-based instrumentation systems for stratified testing10.362005
QCA-based majority gate design under radius of effect-induced faults30.462005
Reliability measurement of mass storage system for onboard instrumentation20.372005
Logic Restructuring for Delay Balancing in Wave-Pipelined Circuits: An Integer Programming Approach00.342005
Teaching Nanotechnology by Introducing Crossbar-Based Architecture and Quantum-Dot Cellular Automata40.662005
Sequential diagnosis of processor array systems80.482004
Probabilistic balancing of fault coverage and test cost in combined built-in self-test/automated test equipment testing environment10.372004
Modeling yield of carbon-nanotube/silicon-nanowire FET-based nanoarray architecture with h-hot addressing scheme50.652004
Balanced dual-stage repair for dependable embedded memory cores00.342004
Testing Layered Interconnection Networks10.372004
Modeling and analysis of fault tolerant multistage interconnection networks60.502003
Maximal diagnosis of interconnects of random access memories.00.342003
Modeling and Evaluation of the Interconnection-driven Repairability for Distributed Embedded Memory Cores on Chip00.342003
Predicting Defect-Tolerant Yield in the Embedded Core Context70.632003
Regressive Testing for System-on-Chip with Unknown-Good-Yield10.362003
NEED FOR UNDERGRADUATE AND GRADUATE-LEVEL EDUCATION IN TESTING OF MICROELECTRONIC CIRCUITS AND SYSTEMS10.402003
A Fault Tolerant Pipelined Cluster Model00.342002
Dynamic yield analysis and enhancement of fpga reconfigurable memory systems40.612002
Dependability under Malicious Agreement in N-modular Redundancy-on-Demand Systems30.452001
Design Verification of FPGA Implementations10.411999
Modeling Quality Reduction of Multichip Module Systems due to Uneven Fault-Coverage and Imperfect Diagnosis.50.541996