Hybrid Chain And Dependability | 0 | 0.34 | 2020 |
A Variable Bulk Arrival and Static Bulk Service Queueing Model for Blockchain | 0 | 0.34 | 2020 |
Slim Chain and Dependability | 0 | 0.34 | 2020 |
Transaction sampling algorithms for real-time crypto block dependability. | 0 | 0.34 | 2020 |
Availability modelling and assurance for a big data computing. | 0 | 0.34 | 2019 |
Optimized Common Parameter Set Extraction Framework By Multiple Benchmarking Applications On A Big Data Platform | 0 | 0.34 | 2018 |
The Dependability Of Crypto Linked Off-Chain File Systems In Backend Blockchain Analytics Engine | 0 | 0.34 | 2018 |
Availability Modeling and Assurance of Map-Reduce Computing. | 0 | 0.34 | 2017 |
Performance evaluation and tuning for MapReduce computing in Hadoop distributed file system | 0 | 0.34 | 2015 |
Dynamic data rebalancing in Hadoop | 1 | 0.37 | 2014 |
Modeling and analysis of repair and maintenance processes in Fault Tolerant Systems | 0 | 0.34 | 2013 |
Reliability Modeling and Analysis of Clockless Wave Pipeline Core for Embedded Combinational Logic Design | 0 | 0.34 | 2010 |
An extraction method of lip movement images from successive image frames in the speech activity extraction process | 0 | 0.34 | 2010 |
A New Approach for Time Series Forecasting based on Genetic Algorithm | 0 | 0.34 | 2010 |
Introduction to the special section on nanocircuits and systems | 0 | 0.34 | 2009 |
A Probabilistic Risk Estimation with Multiple Regression Dependent Dummy Variable Method using Logit Transformation | 0 | 0.34 | 2008 |
Modeling and Evaluation of Threshold Defect Tolerance | 0 | 0.34 | 2008 |
Designing layout-timing independent quantum-dot cellular automata (QCA) circuits by global asynchrony | 9 | 0.93 | 2007 |
Leakage Minimization Technique for Nanoscale CMOS VLSI | 2 | 0.51 | 2007 |
Cost-Driven Optimization of Coverage of Combined Built-In Self-Test/Automated Test Equipment Testing | 2 | 0.40 | 2007 |
Efficient and Robust Delay-Insensitive QCA (Quantum-Dot Cellular Automata) Design | 5 | 0.63 | 2006 |
Exploratory Data Analysis with Bivariate Dependence Functions | 0 | 0.34 | 2006 |
Environmental-based characterization of SoC-based instrumentation systems for stratified testing | 1 | 0.36 | 2005 |
QCA-based majority gate design under radius of effect-induced faults | 3 | 0.46 | 2005 |
Reliability measurement of mass storage system for onboard instrumentation | 2 | 0.37 | 2005 |
Logic Restructuring for Delay Balancing in Wave-Pipelined Circuits: An Integer Programming Approach | 0 | 0.34 | 2005 |
Teaching Nanotechnology by Introducing Crossbar-Based Architecture and Quantum-Dot Cellular Automata | 4 | 0.66 | 2005 |
Sequential diagnosis of processor array systems | 8 | 0.48 | 2004 |
Probabilistic balancing of fault coverage and test cost in combined built-in self-test/automated test equipment testing environment | 1 | 0.37 | 2004 |
Modeling yield of carbon-nanotube/silicon-nanowire FET-based nanoarray architecture with h-hot addressing scheme | 5 | 0.65 | 2004 |
Balanced dual-stage repair for dependable embedded memory cores | 0 | 0.34 | 2004 |
Testing Layered Interconnection Networks | 1 | 0.37 | 2004 |
Modeling and analysis of fault tolerant multistage interconnection networks | 6 | 0.50 | 2003 |
Maximal diagnosis of interconnects of random access memories. | 0 | 0.34 | 2003 |
Modeling and Evaluation of the Interconnection-driven Repairability for Distributed Embedded Memory Cores on Chip | 0 | 0.34 | 2003 |
Predicting Defect-Tolerant Yield in the Embedded Core Context | 7 | 0.63 | 2003 |
Regressive Testing for System-on-Chip with Unknown-Good-Yield | 1 | 0.36 | 2003 |
NEED FOR UNDERGRADUATE AND GRADUATE-LEVEL EDUCATION IN TESTING OF MICROELECTRONIC CIRCUITS AND SYSTEMS | 1 | 0.40 | 2003 |
A Fault Tolerant Pipelined Cluster Model | 0 | 0.34 | 2002 |
Dynamic yield analysis and enhancement of fpga reconfigurable memory systems | 4 | 0.61 | 2002 |
Dependability under Malicious Agreement in N-modular Redundancy-on-Demand Systems | 3 | 0.45 | 2001 |
Design Verification of FPGA Implementations | 1 | 0.41 | 1999 |
Modeling Quality Reduction of Multichip Module Systems due to Uneven Fault-Coverage and Imperfect Diagnosis. | 5 | 0.54 | 1996 |