Name
Title | Citations | PageRank | Year |
|---|---|---|---|
| The AB-filling methodology for power-aware at-speed scan testing | 0 | 0.34 | 2010 |
| New Scheme of Reducing Shift and Capture Power Using the X-Filling Methodology | 1 | 0.37 | 2009 |
| An efficient test-data compaction for low power VLSI testing | 1 | 0.36 | 2008 |