Author Info
Name
Affiliation
Papers
I. H. JOO
Samsung Electronics Co., Ltd., Nongseo-Dong, Yongin-Si, Gyeonggi-Do 446-711, Republic of Korea
1
Collaborators
Citations 
PageRank 
7
0
0.34
Referers 
Referees 
References 
0
11
2
Title
Citations
PageRank
Year
Hot hole-induced device degradation by drain junction reverse current.00.342013