| Mechanism of gate dielectric degradation by hydrogen migration from the cathode interface. | 0 | 0.34 | 2017 |
| Error Tolerance Analysis of Deep Learning Hardware Using a Restricted Boltzmann Machine Toward Low-Power Memory Implementation | 1 | 0.35 | 2017 |
| Detailed investigation of the effects of La and Al content on the electrical characteristics and reliability properties of La–Al–O gate dielectrics | 0 | 0.34 | 2010 |
