Author Info
Name
Affiliation
Papers
J. VAN SPAANDONK
TECH UNIV EINDHOVEN,GRP EEB,5600 MB EINDHOVEN,NETHERLANDS
3
Collaborators
Citations 
PageRank 
3
15
2.60
Referers 
Referees 
References 
43
14
12
Title
Citations
PageRank
Year
Selecting measurements to test the functional behavior of analog circuits40.561996
Iterative test-point selection for analog circuits91.651996
DC Testing of Analog Integrated Circuits with Piecewise Linear Approximation and Interval Analysis20.391993