Name
Abstract | ||
|---|---|---|
This paper presents a method for functional testing of analog circuits, on the basis of circuit sensitivities. The approach selects the minimum number of measurements that allows a precise prediction of a circuit's functional behavior. A criterion is applied to this predicted behavior to determine if the circuit functions according to specifications. The presented method combines a matrix decomposition technique (the singular value decomposition) with an iterative algorithm to select measurements. The number of measurements is determined on the basis of the desired precision of the response prediction and the influence of random measurement errors. Examples demonstrate that the resulting method tests the functional circuit behavior with a high precision, even in the presence of large measurement errors. |
Year | DOI | Venue |
|---|---|---|
1996 | 10.1007/BF00137561 | J. Electronic Testing |
Keywords | Field | DocType |
analogue circuits,circuit testing,automatic testing | Analogue circuits,Singular value decomposition,Analogue electronics,Computer science,Iterative method,Matrix decomposition,Functional testing,Automatic testing,Electronic engineering,Observational error | Journal |
Volume | Issue | ISSN |
9 | 1-2 | 0923-8174 |
Citations | PageRank | References |
4 | 0.56 | 5 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| J. Van Spaandonk | 1 | 15 | 2.60 |
| Tom A. M. Kevenaar | 2 | 344 | 21.90 |