Author Info
Name
Affiliation
Papers
FRANÇOIS DARLAY
Swiss Federal Institute of Technology, Electronics Laboratories, LEG/EL Ecublens CH-1015 Lausanne, Switzerland
1
Collaborators
Citations 
PageRank 
0
0
0.34
Referers 
Referees 
References 
0
13
8
Title
Citations
PageRank
Year
Detection of multiple stuck-on/stuck-open faults by single faults test sets in MOS transistor networks00.341991