Paper Info
Title
Detection of multiple stuck-on/stuck-open faults by single faults test sets in MOS transistor networks
Abstract
The present paper is a theoretical study of multiple stuck-on/stuck-open faults in MOS transistor networks. We show that, under two conditions, the detection of all single faults of a transistor network implies the detection of all multiple faults of the network. Several examples of applications are given, which induce a sensible increase of the test efficiency.
Year
DOI
Venue
1991
10.1016/0165-6074(91)90437-X
MICROPROCESSING AND MICROPROGRAMMING
DocType
Volume
Issue
Journal
32
1-5
ISSN
Citations 
PageRank 
0165-6074
0
0.34
References 
Authors
8
1
Name
Order
Citations
PageRank
François Darlay100.34