Author Info
Name
Affiliation
Papers
HARRY A. SCHAFFT
Corresponding author. Fax: +1-301-948-4081
4
Collaborators
Citations 
PageRank 
10
4
2.20
Referers 
Referees 
References 
8
7
3
Title
Citations
PageRank
Year
Experimental and simulation studies of resistivity in nanoscale copper films00.342009
Modeling and simulation of resistivity of nanometer scale copper10.482006
Early reliability assessment by using deep censoring00.342003
Improved estimation of the resistivity of pure copper and electrical determination of thin copper film dimensions31.042001