Author Info
Name
Affiliation
Papers
SANG SIK PARK
Department of Electronics Engineering, Sejong University, 98 Kunja-dong, Kwangjin-gu, Seoul 143-747, South Korea
1
Collaborators
Citations 
PageRank 
6
0
0.34
Referers 
Referees 
References 
0
4
1
Title
Citations
PageRank
Year
Effects of electrical stress on mid-gap interface trap density and capture cross sections in n-MOSFETs characterized by pulsed interface probing measurements00.342004