Author Info
Name
Affiliation
Papers
M. RAFIK
STMicroelectronics, BP16, 38921 Crolles, France
5
Collaborators
Citations 
PageRank 
26
5
2.13
Referers 
Referees 
References 
34
17
5
Title
Citations
PageRank
Year
Process Optimization for HCI Improvement in I/O Analog Devices00.342019
Impact of Passive & Active Load Gate Impedance on Breakdown Hardness in 28nm FDSOI Technology00.342019
Challenges and opportunity in performance, variability and reliability in sub-45 nm CMOS technologies.30.502011
Unified soft breakdown MOSFETs compact model: From experiments to circuit simulation00.342010
Process dependence of BTI reliability in advanced HK MG stacks20.622009