Name
Title | ||
|---|---|---|
Impact of Passive & Active Load Gate Impedance on Breakdown Hardness in 28nm FDSOI Technology |
Abstract | ||
|---|---|---|
The impact of integrated gate impedances, passive (polycomb, R
<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">G</inf>
) and active (Input/Output MOSfet, Z
<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">load</inf>
), on the breakdown (BD) behaviors of 28nm Fully-Depleted Silicon-On-Insulator (FDSOI) transistors is discussed. It has been shown that R
<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">G</inf>
and Z
<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">load</inf>
affect directly the BD hardness of the devices. By reducing the BD hardness, a catastrophic failure of gate dielectric meaning complete loss of device functionalities can be avoided. Many configurations of R
<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">G</inf>
, Z
<inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">load</inf>
are considered to obtain the best compromise in terms the BD hardness and functionalities of Device Under Test (DUT). |
Year | DOI | Venue |
|---|---|---|
2019 | 10.1109/IRPS.2019.8720591 | 2019 IEEE International Reliability Physics Symposium (IRPS) |
Keywords | Field | DocType |
CMOS,Breakdown Hardness,FDSOI,TDDB,Reliability | Engineering physics,Active load,Electrical impedance,Electronic engineering,Engineering | Conference |
ISSN | ISBN | Citations |
1541-7026 | 978-1-5386-9504-3 | 0 |
PageRank | References | Authors |
0.34 | 0 | 7 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| A.P. Nguyen | 1 | 0 | 0.34 |
| X. Garros | 2 | 7 | 3.00 |
| M. Rafik | 3 | 5 | 2.13 |
| Florian Cacho | 4 | 14 | 7.99 |
| D. Roy | 5 | 10 | 5.32 |
| X. Federspiel | 6 | 5 | 4.42 |
| F. Gaillard | 7 | 0 | 0.68 |