System-level evaluation of dynamic effects in a GaN-based class-E power amplifier | 0 | 0.34 | 2020 |
EMI-optimized driver for high-frequency boost converter | 0 | 0.34 | 2020 |
Comparison of EMI effects on different current mirror structures using a post-processing framework | 0 | 0.34 | 2020 |
Optimized gate driver for high-frequency buck converter. | 1 | 0.48 | 2018 |
Design and theoretical comparison of input ESD devices in 180 nm CMOS with focus on low capacitance. | 0 | 0.34 | 2018 |
Mikroelektronik aus Österreich - Grundlage für Österreichs Innovations- und Wettbewerbsfähigkeit. | 0 | 0.34 | 2018 |
Innovativer HVDC-DC-Wandler für Hochspannungs-Gleichstrom-Netze - Grundsätzliche Überlegungen zu Topologie, Regelung und elektromagnetischer Verträglichkeit. | 0 | 0.34 | 2018 |
Intelligent NFC potassium measurement strip with hemolysis check in capillary blood. | 0 | 0.34 | 2018 |
Impact of electromagnetic interference on the functional safety of smart power devices for automotive applications. | 0 | 0.34 | 2018 |
A Temperature Analysis for NFC-Powered Smart Lab-on-Chip Devices | 0 | 0.34 | 2018 |
Autonomous maximum power point tracking algorithm for ultra-low power energy harvesting | 0 | 0.34 | 2017 |
A system-on-chip NFC bicycle tire pressure measurement system | 0 | 0.34 | 2017 |
Von der Blitzentladung bis zu ESD-Testverfahren - Beanspruchungen von Geräten und integrierten Schaltungen sowie normative Anforderungen. | 0 | 0.34 | 2016 |
Intelligent plaster for accurate body temperature monitoring and investigations regarding EMI using near-field magnetic scan. | 1 | 0.43 | 2016 |
Elektromagnetische Verträglichkeit und Robustheit elektronischer Systeme als Herausforderung des Technologiezeitalters. | 0 | 0.34 | 2016 |
Highlighting the distribution path of transient disturbances by near field scanning techniques. | 0 | 0.34 | 2016 |
Energy harvesting with on-chip solar cells and integrated DC/DC converter | 2 | 0.51 | 2015 |
EMV elektronischer Unterbaugruppen und integrierter Schaltkreise im Kraftfahrzeug | 0 | 0.34 | 2006 |
Vergleichende EMV-Untersuchungen auf Geräte- und IC-Ebene | 1 | 0.63 | 2006 |
Measures to Reduce the Electromagnetic Emission of a SoC | 0 | 0.34 | 2003 |
TEM-cell and surface scan to identify the electromagnetic emission of integrated circuits | 2 | 0.89 | 2003 |