| Msiff: A Radiation-Hardened Flip-Flop Via Interleaving Master-Slave Stage Layout Topology | 0 | 0.34 | 2020 |
| Research On The Influences Of Well Structure On Dose Rate Effects In 65nm Cmos Circuit | 0 | 0.34 | 2020 |
| Supply Voltage and Temperature Dependence of Single-Event Transient in 28-nm FDSOI MOSFETs. | 0 | 0.34 | 2019 |
| 28nm Fault-Tolerant Hardening-by-Design Frequency Divider for Reducing Soft Errors in Clock and Data Recovery | 0 | 0.34 | 2019 |
| A Single-Event Upset Evaluation Approach Using Ion-Induced Sensitive Area | 0 | 0.34 | 2019 |
| Characterization Of P-Hit And N-Hit Single-Event Transient Using Heavy Ion Microbeam | 0 | 0.34 | 2019 |
| Comparison of single-event upset generated by heavy ion and pulsed laser. | 0 | 0.34 | 2017 |
| Modeling the impact of process and operation variations on the soft error rate of digital circuits. | 0 | 0.34 | 2017 |
| A Programmable Pre-emphasis Transmitter for SerDes in 40 nm CMOS. | 0 | 0.34 | 2017 |
| Research On Single-Event Transient Mechanism In A Novel Soi Cmos Technology | 0 | 0.34 | 2014 |
| A low contact resistance graphene field effect transistor with single-layer-channel and multi-layer-contact | 0 | 0.34 | 2014 |
| A Scan Chain Based SEU Test Method for Microprocessors | 0 | 0.34 | 2013 |
| Reconfigurable logic gate implemented by suspended-gate single-electron transistors | 0 | 0.34 | 2010 |
| Analysis of negative differential conductance of single-island single-electron transistors owing to Coulomb oscillations | 2 | 0.77 | 2010 |
