Name
Title | Citations | PageRank | Year |
|---|---|---|---|
| Minimizing Power Consumption in Scan Testing: Pattern Generation and DFT Techniques | 169 | 5.86 | 2004 |
| Minimizing Power Consumption in Scan Testing: Pattern Generation and DFT Techniques | 169 | 5.86 | 2004 |
| Logic BIST for Large Industrial Designs: Real Issues and Case Studies | 173 | 17.93 | 1999 |