Author Info
Name
Affiliation
Papers
D. FAUJOUR
ST Microelectronics, Z.I. de Rousset, 13106 Rousset, France
1
Collaborators
Citations 
PageRank 
7
0
0.34
Referers 
Referees 
References 
0
0
0
Title
Citations
PageRank
Year
Short defect characterization based on TCR parameter extraction00.342003